Extraction of the Contact Resistance of Carbon Nanotube Field Effect Transistors Using the Bias Extrapolation Method and Statistical Measurements

Title
Extraction of the Contact Resistance of Carbon Nanotube Field Effect Transistors Using the Bias Extrapolation Method and Statistical Measurements
Authors
Keywords
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Journal
IEEE TRANSACTIONS ON ELECTRON DEVICES
Volume 70, Issue 11, Pages 6057-6063
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2023-10-12
DOI
10.1109/ted.2023.3318875

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