An edge-located uniform pattern recovery mechanism using statistical feature-based optimal center pixel selection strategy for local binary pattern
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Title
An edge-located uniform pattern recovery mechanism using statistical feature-based optimal center pixel selection strategy for local binary pattern
Authors
Keywords
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Journal
EXPERT SYSTEMS WITH APPLICATIONS
Volume 221, Issue -, Pages 119763
Publisher
Elsevier BV
Online
2023-02-28
DOI
10.1016/j.eswa.2023.119763
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