Effect of post-growth annealing on the structural, optical and electrical properties of V 2 O 5 nanorods and its fabrication, characterization of V 2 O 5 /p-Si junction diode

Published 2016 View Full Article

Authors

Keywords

V, 2, O, 5, Morphological, Phase change, Electrical properties, Junction diode

Journal

MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING

Volume 41, Issue -, Pages 497-507

Publisher

Elsevier BV

Online

2015-11-21

DOI

10.1016/j.mssp.2015.08.020

Ask authors/readers for more resources

Protocol

Community support

Reagent

Community support

Reprint

Contact the author

Find Funding. Review Successful Grants.

Explore over 25,000 new funding opportunities and over 6,000,000 successful grants.

Explore

Become a Peeref-certified reviewer

The Peeref Institute provides free reviewer training that teaches the core competencies of the academic peer review process.

Get Started