Journal
MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING
Volume 46, Issue -, Pages 29-34Publisher
ELSEVIER SCI LTD
DOI: 10.1016/j.mssp.2015.10.012
Keywords
Samarium telluride; X-ray diffraction; Cyclic voltammetry; Specific capacitance; Electrochemical impedance spectroscopy
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Funding
- Council of Scientific and Industrial Research (CSIR), New Delhi [09/816(0038)/2014EMR-I]
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The present paper deals with synthesis of samarium telluride (Sm2Te3) thin films using simple and low cost successive ionic layer adsorption and reaction (SILAR) method for supercapacitor application. The Sm2Te3 thin films are characterized by X-ray diffraction (XRD) for structural determination, energy dispersive analysis of X-ray (EDAX) for elemental composition, field emission scanning electron microscopy (FE-SEM) for surface morphological study and contact angle measurement for wettability study. The Sm2Te3 exhibits orthorhombic crystal structure with cloud like surface morphology. The film surface showed lyophilic behavior with contact angle of 5.7 degrees for propylene carbonate (PC). Further, electrochemical measurements are carried out in LiClO4-PC electrolyte using cyclic voltammetry (CV), galvanostatic charge discharge and electrochemical impedance spectroscopy (EIS) techniques. The Sm2Te3 film showed maximum specific capacitance and energy density of 144 F g(-1) and 10 W h kg(-1) respectively. The EIS study showed negligible change in resistive parameters after 1000 electrochemical cycles. (C) 2016 Published by Elsevier Ltd.
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