Thickness-dependent growth orientation of F-doped ZnO films formed by atomic layer deposition

Title
Thickness-dependent growth orientation of F-doped ZnO films formed by atomic layer deposition
Authors
Keywords
-
Journal
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A
Volume 34, Issue 1, Pages 01A144
Publisher
American Vacuum Society
Online
2015-12-23
DOI
10.1116/1.4938180

Ask authors/readers for more resources

Discover Peeref hubs

Discuss science. Find collaborators. Network.

Join a conversation

Become a Peeref-certified reviewer

The Peeref Institute provides free reviewer training that teaches the core competencies of the academic peer review process.

Get Started