The annealing effects on the properties of solution-processed alumina thin film and its application in TFTs

Title
The annealing effects on the properties of solution-processed alumina thin film and its application in TFTs
Authors
Keywords
Solution process, Aluminum oxide, Dielectric, Thin film transistor
Journal
CERAMICS INTERNATIONAL
Volume 41, Issue -, Pages S349-S355
Publisher
Elsevier BV
Online
2015-04-06
DOI
10.1016/j.ceramint.2015.03.155

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