Deep learning assisted non-contact defect identification method using diffraction phase microscopy

Published 2023 View Full Article

  1. Home
  2. Publications
  3. Publication Search
  4. Publication Details
Title
Deep learning assisted non-contact defect identification method using diffraction phase microscopy
Authors
Keywords
-
Journal
APPLIED OPTICS
Volume -, Issue -, Pages -
Publisher
Optica Publishing Group
Online
2023-06-20
DOI
10.1364/ao.489867

Ask authors/readers for more resources

Protocol

Community support

Reagent

Community support

Reprint

Contact the author

Find Funding. Review Successful Grants.

Explore over 25,000 new funding opportunities and over 6,000,000 successful grants.

Explore

Discover Peeref hubs

Discuss science. Find collaborators. Network.

Join a conversation
Webinars Posters Questions Hubs Funding Journals Articles Connect Collections Reviewers About Us FAQs Mobile App Privacy Policy Terms of Use
© Peeref 2019-2024. All rights reserved.