4.6 Article

Self-driven and ultrasensitive room-temperature terahertz photodetector based on graphene-Ta2NiSe5 van der Waals heterojunction

Journal

INFRARED PHYSICS & TECHNOLOGY
Volume 128, Issue -, Pages -

Publisher

ELSEVIER
DOI: 10.1016/j.infrared.2022.104474

Keywords

Van der waals heterojunction; THz photodetector; Self -driven

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This study demonstrates a self-driven and ultra-sensitive room temperature terahertz (THz) photodetector based on an asymmetrically contacted graphene-Ta2NiSe5 van der Waals heterojunction. The detector exhibits an ultra-fast photoresponse, high responsivity, and low noise equivalent power at specific THz frequencies. Moreover, the detector achieves high-resolution THz imaging at room temperature and performs significantly better with a small bias voltage. These results present the feasibility of superior room temperature THz detection and have promising prospects in analytical applications, ultrafast sensing, and security monitoring.
Terahertz (THz) technology has developed vigorously and demonstrated a wide range of application prospects in various fields, ranging from biomedical and deep space exploration to wireless communications and nondestructive detection. Therefore, the room temperature (RT) sensitive low-power THz detectors are of great technical significance for the development of THz technology. Two-dimensional materials as the superior candidates for next-generation electronics and optoelectronics integrated devices are drawing increasing attention for their unique confined structure and abundant properties. Especially, construction of heterojunction is an alternative method for improving the photoelectric performance of the detectors. Herein, we have demonstrated self-driven and ultra-sensitive RT THz photodetector based on asymmetrically contacted Graphene-Ta2NiSe5 van der Waals heterojunction. Surprisingly, the proposed self-driven THz photodetector is superb with an ultra-fast photoresponse (720 ns), a high responsivity (24.2 mA/W and 18.2 mA/W), and a low noise equivalent power (41 nW/Hz0.5 and 55 nW/Hz0.5) at 0.12 THz and 0.30 THz, respectively. More importantly, the detector achieves high-resolution THz imaging at RT, and the performances of the devices are significantly improved by applying a small bias voltage (100 mV). Our results present the feasibility for realizing superior RT THz detection and exhibit promising prospects in analytical applications, ultrafast sensing and security monitoring.

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