4.8 Article

Programmable Nucleation and Growth of Ultrathin Tellurium Nanowires via a Pulsed Physical Vapor Deposition Design

Journal

ADVANCED FUNCTIONAL MATERIALS
Volume 33, Issue 11, Pages -

Publisher

WILEY-V C H VERLAG GMBH
DOI: 10.1002/adfm.202211527

Keywords

field-effect transistors; nucleation and growth; pulsed deposition; tellurium nanowires; ultrathin

Ask authors/readers for more resources

Physical vapor deposition (PVD) methods, traditionally used for crystal growth and thin-film deposition, face challenges in fabricating low dimensional nanostructures. A pulsed PVD method is introduced, allowing precise control of temperature and heating time, enabling the separation of nucleation and growth events. The new method yields uniform and high-density nanostructures, in contrast to the random structures formed in conventional PVD.
Physical vapor deposition (PVD) methods have been widely employed for high-quality crystal growth and thin-film deposition in semiconductor electronics. However, the fabrication of emerging low dimensional nanostructures is hitherto challenging in conventional PVD systems due to their large thermal mass and near-continuous operation which hinder flexible control of the nucleation and growth events. Herein, a pulsed PVD method is reported that features finely controllable temperature and heating time (down to milliseconds), which enables programming of the vapor supersaturation and decoupling of nucleation and growth events. Take tellurium as an example, the pulsed PVD allows transient source vaporization (approximate to 1000 degrees C, 30 ms) for burst nucleation, followed by relatively low-temperature volatilization (approximate to 600 degrees C, 5 min) for steady-state growth with well-suppressed random nucleation. As a result, uniform and high-density tellurium nanowires are obtained at the ultrathin thickness of sub-10 nm and length >10 mu m, which is in sharp contrast to the randomly formed nanostructures in conventional PVD. When used in the field-effect transistor, the thin tellurium nanowires display a high on-off ratio of >10(4) and hole mobility of approximate to 40 cm(2) V-1 s(-1), showing the potential for high-performance electronics. Pulsed PVD therefore enables to flexibly program and finely tailor the nucleation and growth events during vapor phase deposition, which are otherwise impossible in conventional PVD.

Authors

I am an author on this paper
Click your name to claim this paper and add it to your profile.

Reviews

Primary Rating

4.8
Not enough ratings

Secondary Ratings

Novelty
-
Significance
-
Scientific rigor
-
Rate this paper

Recommended

No Data Available
No Data Available