Interfacial reaction and IMCs growth behavior of Sn3Ag0.5Cu/Ni solder bump during aging at various temperatures
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Title
Interfacial reaction and IMCs growth behavior of Sn3Ag0.5Cu/Ni solder bump during aging at various temperatures
Authors
Keywords
Solder Joint, Aging Time, Solder Alloy, Solder Bump, 3Sn4 Phase
Journal
JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS
Volume 27, Issue 5, Pages 4245-4252
Publisher
Springer Nature
Online
2016-01-08
DOI
10.1007/s10854-016-4288-9
References
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- Geometry effect on mechanical performance and fracture behavior of micro-scale ball grid array structure Cu/Sn–3.0Ag–0.5Cu/Cu solder joints
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- Effects of third element and surface finish on interfacial reactions of Sn–Ag–xCu (or Ni)/(Cu or ENIG) solder joints
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- Effect of Cu concentration, solder volume, and temperature on the reaction between SnAgCu solders and Ni
- (2010) S.C. Yang et al. JOURNAL OF ALLOYS AND COMPOUNDS
- Growth mechanism of Ni3Sn4 in a Sn/Ni liquid/solid interfacial reaction
- (2009) J. Shen et al. ACTA MATERIALIA
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