Scaling Trends for Picojoule-per-Bit WDM Photonic Interconnects in CMOS SOI and FinFET Processes

Published 2016 View Full Article

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Title
Scaling Trends for Picojoule-per-Bit WDM Photonic Interconnects in CMOS SOI and FinFET Processes
Authors
Keywords
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Journal
JOURNAL OF LIGHTWAVE TECHNOLOGY
Volume 34, Issue 11, Pages 2730-2742
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2016-03-15
DOI
10.1109/jlt.2016.2542065

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