Can a Programmable Phase Plate Serve as an Aberration Corrector in the Transmission Electron Microscope (TEM)?

Title
Can a Programmable Phase Plate Serve as an Aberration Corrector in the Transmission Electron Microscope (TEM)?
Authors
Keywords
-
Journal
MICROSCOPY AND MICROANALYSIS
Volume -, Issue -, Pages 1-10
Publisher
Cambridge University Press (CUP)
Online
2022-09-21
DOI
10.1017/s1431927622012260

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