Probing Local Electronic Transitions in Organic Semiconductors through Energy-Loss Spectrum Imaging in the Transmission Electron Microscope

Title
Probing Local Electronic Transitions in Organic Semiconductors through Energy-Loss Spectrum Imaging in the Transmission Electron Microscope
Authors
Keywords
-
Journal
ADVANCED FUNCTIONAL MATERIALS
Volume 25, Issue 38, Pages 6071-6076
Publisher
Wiley
Online
2015-09-03
DOI
10.1002/adfm.201502090

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