Direct measurement of surface photovoltage by AC bias Kelvin probe force microscopy
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Title
Direct measurement of surface photovoltage by AC bias Kelvin probe force microscopy
Authors
Keywords
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Journal
Beilstein Journal of Nanotechnology
Volume 13, Issue -, Pages 712-720
Publisher
Beilstein Institut
Online
2022-07-25
DOI
10.3762/bjnano.13.63
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