Direct measurement of surface photovoltage by AC bias Kelvin probe force microscopy

Title
Direct measurement of surface photovoltage by AC bias Kelvin probe force microscopy
Authors
Keywords
-
Journal
Beilstein Journal of Nanotechnology
Volume 13, Issue -, Pages 712-720
Publisher
Beilstein Institut
Online
2022-07-25
DOI
10.3762/bjnano.13.63

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