4.6 Article

Fundamental linewidth of an AlN microcavity Raman laser

Journal

OPTICS LETTERS
Volume 47, Issue 17, Pages 4295-4298

Publisher

Optica Publishing Group
DOI: 10.1364/OL.466195

Keywords

-

Categories

Funding

  1. National Natural Science Foundation of China [61975090, 62022080, 62175127]
  2. National Key Research and Development Program of China [2021YFB2801200]
  3. State Key Laboratory of Advanced Optical Communication Systems and Networks

Ask authors/readers for more resources

In this study, we measured the fundamental linewidth of a laser in high-quality crystalline microcavities, and found an inverse relationship with the emission power. We also derived the limit of the fundamental linewidth, independent of the Q-factor. These findings are important for the development of highly coherent chip-based lasers.
Raman lasing can be a promising way to generate highly coherent chip-based lasers, especially in high-quality (highQ) crystalline microcavities. Here, we measure the fundamental linewidth of a stimulated Raman laser in an aluminum nitride (AlN)-on-sapphire microcavity with a record Q-factor up to 3.7 million. An inverse relationship between fundamental linewidth and emission power is observed. A limit of the fundamental linewidth, independent of Q-factor, due to Raman-pump-induced Kerr parametric oscillation is derived. (c) 2022 Optica Publishing Group

Authors

I am an author on this paper
Click your name to claim this paper and add it to your profile.

Reviews

Primary Rating

4.6
Not enough ratings

Secondary Ratings

Novelty
-
Significance
-
Scientific rigor
-
Rate this paper

Recommended

No Data Available
No Data Available