On the Value of Oversampling for Deep Learning in Software Defect Prediction

Published 2021 View Full Article

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Title
On the Value of Oversampling for Deep Learning in Software Defect Prediction
Authors
Keywords
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Journal
IEEE TRANSACTIONS ON SOFTWARE ENGINEERING
Volume 48, Issue 8, Pages 3103-3116
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2021-05-13
DOI
10.1109/tse.2021.3079841

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