Turn-to-Turn Short Circuit Fault Localization in Transformer Winding via Image Processing and Deep Learning Method
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Title
Turn-to-Turn Short Circuit Fault Localization in Transformer Winding via Image Processing and Deep Learning Method
Authors
Keywords
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Journal
IEEE Transactions on Industrial Informatics
Volume 18, Issue 7, Pages 4417-4426
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2021-08-19
DOI
10.1109/tii.2021.3105932
References
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