Journal
ADVANCED MATERIALS
Volume 34, Issue 33, Pages -Publisher
WILEY-V C H VERLAG GMBH
DOI: 10.1002/adma.202203766
Keywords
linear polarization; mid-infrared region; polarimetry; twisted 2D heterostructures; unipolar barriers
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Funding
- National Natural Science Foundation of China (NSFC) [61922005, U1930105]
- Beijing Natural Science Foundation (BNSF) [JQ20027]
- National Research Foundation Singapore programme [NRF-CRP19-2017-01, NRF-CRP22-2019-0007]
- A*STAR [A18A7b0058, A2090b0144]
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This study reports a bias-switchable polarization detection method using a twisted unipolar-barrier van der Waals heterostructure, which enables the detection of full states of polarization (SOP) and holds promise for on-chip miniaturized polarimeters.
Polarization-resolved photodetection in a compact footprint is of great interest for ultraminiaturized polarimeters to be used in a wide range of applications. However, probing the states of polarization (SOP) in materials with natural anisotropy are usually weak, limited by the material's natural dichroism or diattenuation. Here, a twisted unipolar-barrier van der Waals heterostructure (vdWH) to construct a bias-switchable polarization detection for retrieval of full SOP (from 0 to 180 degrees) for linear polarized incident light is reported. As a demonstration example, this study realizes the concept in a b-AsP/WS2/b-AsP vdWH relying on the natural anisotropic properties of the materials without using additional plasmonic/metasurface nanostructures to realize linear polarimetry in the mid-infrared range. Polarimetric imaging is further demonstrated with the developed linear polarimetry by directly displaying the Jones-vector-described SOP distribution of certain target object. This method, with the capabilities of detecting full linear SOP, is promising for the next-generation on-chip miniaturized polarimeters.
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