A Ku-Band Eight-Element Phased-Array Transmitter With Built-in Self-Test Capability in 180-nm CMOS Technology

Published 2022 View Full Article

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Title
A Ku-Band Eight-Element Phased-Array Transmitter With Built-in Self-Test Capability in 180-nm CMOS Technology
Authors
Keywords
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Journal
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS
Volume 30, Issue 6, Pages 694-705
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2022-03-26
DOI
10.1109/tvlsi.2022.3151383

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