4.6 Article

Electron Backscatter Diffraction Analysis of Inconel 718 Parts Fabricated by Selective Laser Melting Additive Manufacturing

Journal

JOM
Volume 69, Issue 2, Pages 402-408

Publisher

SPRINGER
DOI: 10.1007/s11837-016-2198-1

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Funding

  1. CFD Research Corporation (Huntsville, AL) through a NASA STTR project
  2. Alabama EPSCoR GRSP

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In this study, the crystallographic texture of an Inconel 718 part fabricated by selective laser melting was investigated. The front surface (X-Z plane) microstructure is characterized by the columnar grains growing along the build direction, and the width of columnar grains is in the range of about 75-150 A mu m, with the bottom layers having narrower grains as a result of a higher cooling rate. In addition to equiaxed grains, the top surface (X-Y plane) has a feature of patch patterns resulting from the laser scanning strategy. Based on the electron backscatter diffraction results, there appears only weak crystallographic texture in both the X-Z plane and the X-Y plane of the part. From the grain boundary map, the microstructures are composed of high-angle boundaries with a larger fraction of subgrain boundaries.

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