Scanning quantum dot microscopy: A quantitative method to measure local electrostatic potential near surfaces

Published 2016 View Full Article

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Title
Scanning quantum dot microscopy: A quantitative method to measure local electrostatic potential near surfaces
Authors
Keywords
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Journal
JAPANESE JOURNAL OF APPLIED PHYSICS
Volume 55, Issue 8S1, Pages 08NA04
Publisher
Japan Society of Applied Physics
Online
2016-07-20
DOI
10.7567/jjap.55.08na04

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