Modeling and simulation of ionizing radiation effect on ferroelectric field-effect transistor

Published 2016 View Full Article

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Title
Modeling and simulation of ionizing radiation effect on ferroelectric field-effect transistor
Authors
Keywords
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Journal
JAPANESE JOURNAL OF APPLIED PHYSICS
Volume 55, Issue 4, Pages 048001
Publisher
Japan Society of Applied Physics
Online
2016-03-01
DOI
10.7567/jjap.55.048001

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