Effectual Interface and Defect Engineering for Auger Recombination Suppression in Bright InP/ZnSeS/ZnS Quantum Dots
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Title
Effectual Interface and Defect Engineering for Auger Recombination Suppression in Bright InP/ZnSeS/ZnS Quantum Dots
Authors
Keywords
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Journal
ACS Applied Materials & Interfaces
Volume 14, Issue 10, Pages 12479-12487
Publisher
American Chemical Society (ACS)
Online
2022-03-03
DOI
10.1021/acsami.1c20088
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