Cryogenic electron microscopy reveals that applied pressure promotes short circuits in Li batteries

Title
Cryogenic electron microscopy reveals that applied pressure promotes short circuits in Li batteries
Authors
Keywords
-
Journal
iScience
Volume 24, Issue 12, Pages 103394
Publisher
Elsevier BV
Online
2021-11-02
DOI
10.1016/j.isci.2021.103394

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