Density functional tight binding approach utilized to study X-ray-induced transitions in solid materials

Title
Density functional tight binding approach utilized to study X-ray-induced transitions in solid materials
Authors
Keywords
-
Journal
Scientific Reports
Volume 12, Issue 1, Pages -
Publisher
Springer Science and Business Media LLC
Online
2022-01-28
DOI
10.1038/s41598-022-04775-1

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