Design and process variation analysis of CNTFET-based ternary memory cells

Published 2016 View Full Article

  1. Home
  2. Publications
  3. Publication Search
  4. Publication Details
Title
Design and process variation analysis of CNTFET-based ternary memory cells
Authors
Keywords
CNTFET, Ternary SRAM design, Process variation
Journal
INTEGRATION-THE VLSI JOURNAL
Volume 54, Issue -, Pages 97-108
Publisher
Elsevier BV
Online
2016-02-27
DOI
10.1016/j.vlsi.2016.02.003

Ask authors/readers for more resources

Protocol

Community support

Reagent

Community support

Reprint

Contact the author

Find Funding. Review Successful Grants.

Explore over 25,000 new funding opportunities and over 6,000,000 successful grants.

Explore

Create your own webinar

Interested in hosting your own webinar? Check the schedule and propose your idea to the Peeref Content Team.

Create Now
Webinars Posters Questions Hubs Funding Journals Articles Connect Collections Reviewers About Us FAQs Mobile App Privacy Policy Terms of Use
© Peeref 2019-2024. All rights reserved.