Time-dependent reliability assessment of aging structures considering stochastic resistance degradation process
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Title
Time-dependent reliability assessment of aging structures considering stochastic resistance degradation process
Authors
Keywords
Aging structure, Reliability, Resistance, Stochastic degradation, Random field, Gamma process
Journal
RELIABILITY ENGINEERING & SYSTEM SAFETY
Volume 217, Issue -, Pages 108105
Publisher
Elsevier BV
Online
2021-09-28
DOI
10.1016/j.ress.2021.108105
References
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