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Title
RF/Analog performance of GaAs Multi-Fin FinFET with stress effect
Authors
Keywords
VIP, SS, DMG, SCE, TGF
Journal
MICROELECTRONICS JOURNAL
Volume 117, Issue -, Pages 105267
Publisher
Elsevier BV
Online
2021-09-25
DOI
10.1016/j.mejo.2021.105267
References
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