Effect of thin gate dielectrics on DC, radio frequency and linearity characteristics of lattice-matched AlInN/AlN/GaN metal–oxide–semiconductor high electron mobility transistor

Title
Effect of thin gate dielectrics on DC, radio frequency and linearity characteristics of lattice-matched AlInN/AlN/GaN metal–oxide–semiconductor high electron mobility transistor
Authors
Keywords
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Journal
IET Circuits Devices & Systems
Volume 10, Issue 5, Pages 423-432
Publisher
Institution of Engineering and Technology (IET)
Online
2016-04-11
DOI
10.1049/iet-cds.2015.0332

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