Journal
JOURNAL OF CRYSTAL GROWTH
Volume 577, Issue -, Pages -Publisher
ELSEVIER
DOI: 10.1016/j.jcrysgro.2021.126403
Keywords
A1; Defects; A1; Directional solidification; A1; Nucleation; A1; Optical microscopy; A2; Growth from melt; B2; Semiconducting indium compounds
Funding
- JSPS KAKENHI [JP20K15070, JP21H04658]
- SEI Group CSR Foundation
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The study observed the formation of twin boundaries during directional solidification of compound semiconductor InSb. A groove formed at the junction of a solid-liquid interface and a sigma 9 grain-boundary, with rapid growth occurring to fill the groove. Calculations of the change in free energy associated with nucleation at the grain-boundary groove showed a preferential twin nucleation at the bottom of the groove, consistent with direct observations.
We investigated twin boundary formation during directional solidification of the compound semiconductor InSb. We directly observed a groove formed at the junction of a solid-liquid interface and a sigma 9 grain-boundary by optical microscopy. When the depth of the grain-boundary groove reached about 100 mu m, rapid growth occurred to fill the groove. We found that two facet planes of the grain-boundary groove became twin boundary planes. Calculations of the change in free energy associated with nucleation at the grain-boundary groove indicates that the preferential twin nucleation occurs at the bottom of the groove, consistent with the direct observations in this study.
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