Comments on “Researcher Bias: The Use of Machine Learning in Software Defect Prediction”

Published 2016 View Full Article

Authors

Keywords

Journal

IEEE TRANSACTIONS ON SOFTWARE ENGINEERING

Volume 42, Issue 11, Pages 1092-1094

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Online

2016-04-12

DOI

10.1109/tse.2016.2553030

Ask authors/readers for more resources

Publish scientific posters with Peeref

Peeref publishes scientific posters from all research disciplines. Our Diamond Open Access policy means free access to content and no publication fees for authors.

Learn More

Create your own webinar

Interested in hosting your own webinar? Check the schedule and propose your idea to the Peeref Content Team.

Create Now

IEEE TRANSACTIONS ON SOFTWARE ENGINEERING

Ask authors/readers for more resources

Protocol

Reagent

Reprint

Publish scientific posters with Peeref

Create your own webinar