4.7 Article

EM Algorithm for One-Shot Device Testing With Competing Risks Under Weibull Distribution

Journal

IEEE TRANSACTIONS ON RELIABILITY
Volume 65, Issue 2, Pages 973-991

Publisher

IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/TR.2015.2500361

Keywords

Class-B insulation data; competing risks; EM algorithm; inequality constrained least-squares; masked data; one-shot device; Weibull distribution

Funding

  1. Natural Sciences and Engineering Research Council of Canada

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This paper provides an extension of the work of Balakrishnan and Ling by introducing a competing risks model into a one-shot device testing analysis under an ALT setting. An expectation maximization (EM) algorithm is then developed for the estimation of model parameters. An extensive Monte Carlo simulation study is carried out to assess the performance of the proposed method. The performance of the EM algorithm and the Fisher scoring method are also compared. Finally, the proposed EM algorithm is applied to a modified Class-B insulation data for illustrating the results developed here.

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