Thermomechanical fatigue damage modeling and material parameter calibration for thin film metallizations
Published 2021 View Full Article
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Title
Thermomechanical fatigue damage modeling and material parameter calibration for thin film metallizations
Authors
Keywords
Semiconductors, Fatigue modeling, Fatigue test methods, Finite elements, Poly-heater experiments
Journal
INTERNATIONAL JOURNAL OF FATIGUE
Volume 155, Issue -, Pages 106627
Publisher
Elsevier BV
Online
2021-10-30
DOI
10.1016/j.ijfatigue.2021.106627
References
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