A Compact Model for Metal–Oxide Resistive Random Access Memory With Experiment Verification

Authors

Keywords

Journal

Volume 63, Issue 5, Pages 1884-1892

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Online

2016-04-08

DOI

10.1109/ted.2016.2545412

Explore over 38,000 international journals covering a vast array of academic fields.

Interested in hosting your own webinar? Check the schedule and propose your idea to the Peeref Content Team.

Create Now