An EBIC Model for TCAD Simulation to Determine the Surface Recombination Rate in Semiconductor Devices

Published 2016 View Full Article

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Title
An EBIC Model for TCAD Simulation to Determine the Surface Recombination Rate in Semiconductor Devices
Authors
Keywords
-
Journal
IEEE TRANSACTIONS ON ELECTRON DEVICES
Volume 63, Issue 11, Pages 4395-4401
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2016-09-21
DOI
10.1109/ted.2016.2606703

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