New insights into error accumulation due to biased particle distribution in semi-implicit particle methods

Title
New insights into error accumulation due to biased particle distribution in semi-implicit particle methods
Authors
Keywords
MPS method, Free surface, High order schemes, Error accumulation, Stability, Biased particle distribution
Journal
Publisher
Elsevier BV
Online
2021-10-26
DOI
10.1016/j.cma.2021.114219

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