ISFETs in CMOS and Emergent Trends in Instrumentation: A Review

Published 2016 View Full Article

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Title
ISFETs in CMOS and Emergent Trends in Instrumentation: A Review
Authors
Keywords
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Journal
IEEE SENSORS JOURNAL
Volume 16, Issue 17, Pages 6496-6514
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2016-06-29
DOI
10.1109/jsen.2016.2585920

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