Elevation Changes Inferred From TanDEM-X Data Over the Mont-Blanc Area: Impact of the X-Band Interferometric Bias

Published 2016 View Full Article

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Title
Elevation Changes Inferred From TanDEM-X Data Over the Mont-Blanc Area: Impact of the X-Band Interferometric Bias
Authors
Keywords
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Journal
IEEE Journal of Selected Topics in Applied Earth Observations and Remote Sensing
Volume 9, Issue 8, Pages 3870-3882
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2016-07-22
DOI
10.1109/jstars.2016.2581482

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