Journal
OPTICS LETTERS
Volume 46, Issue 14, Pages 3352-3355Publisher
OPTICAL SOC AMER
DOI: 10.1364/OL.423626
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Funding
- Deutsche Forschungsgemeinschaft [EXC 2122, 390833453]
- Niedersachsisches Ministerium fur Wissenschaft und Kultur (Quanomet NL5)
- European Regional Development Fund [ZW 685003502]
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This study numerically investigates the potential improvement in spatial resolution of nanothermometers using a stimulated emission depletion microscopy approach. The simulations predict contactless temperature measurement below the diffraction limit, showing the potential of three-dimensional measurements.
Lanthanide-doped nanothermometers are used to measure temperature through changes in their emission characteristic with sensitivities of up to a few %/K. In contrast to their sensitivity, their spatial resolution, which is of critical importance for various applications, has not been thoroughly studied and optimized. We numerically investigated the improvement in spatial resolution of nanothermometers with a stimulated emission depletion microscopy approach. Fundamental relationships between spatial and temperature resolution were identified by using different beam parameters for the excitation and depletion beams. Our simulations predict contactless temperature measurement below the diffraction limit with temperature resolution of +/- 1.25 K. We further studied the influence of sample thickness and position on both temperature and spatial resolution and showed the potential of three-dimensional measurements. (C) 2021 Optical Society of America.
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