A comparative study on electrical characteristics of Ni/n-Si and Ni/p-Si Schottky diodes with Pinus Sylvestris Resin interfacial layer in dark and under illumination at room temperature
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Title
A comparative study on electrical characteristics of Ni/n-Si and Ni/p-Si Schottky diodes with Pinus Sylvestris Resin interfacial layer in dark and under illumination at room temperature
Authors
Keywords
Pinus sylvestris resin (PSR), Illumination effect, Organic interfacial layer, I–V, measurement, C-V, measurement
Journal
OPTICAL MATERIALS
Volume 119, Issue -, Pages 111380
Publisher
Elsevier BV
Online
2021-07-23
DOI
10.1016/j.optmat.2021.111380
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