In-situ quantification of the surface roughness for facile fabrications of atomically smooth thin films
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Title
In-situ quantification of the surface roughness for facile fabrications of atomically smooth thin films
Authors
Keywords
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Journal
Nano Research
Volume -, Issue -, Pages -
Publisher
Springer Science and Business Media LLC
Online
2021-08-13
DOI
10.1007/s12274-021-3720-5
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