Fully automated spectroscopic ellipsometry analyses: Application to MoOx thin films

Machine learning powered ellipsometry

(2021) Jinchao Liu et al.   Light-Science & Applications

Optical Transitions in Hybrid Perovskite Solar Cells: Ellipsometry, Density Functional Theory, and Quantum Efficiency Analyses forCH3NH3PbI3

(2016) Masaki Shirayama et al.   Physical Review Applied

Silicon heterojunction solar cell with passivated hole selective MoOx contact

(2014) Corsin Battaglia et al.   APPLIED PHYSICS LETTERS

Organometallic Halide Perovskites: Sharp Optical Absorption Edge and Its Relation to Photovoltaic Performance

(2014) Stefaan De Wolf et al.   Journal of Physical Chemistry Letters

Complex Refractive Index Spectra of CH3NH3PbI3 Perovskite Thin Films Determined by Spectroscopic Ellipsometry and Spectrophotometry

(2014) Philipp Löper et al.   Journal of Physical Chemistry Letters

Resolving lateral and vertical structures by ellipsometry using wavelength range scan

(2014) P. Petrik et al.   THIN SOLID FILMS

Dielectric function of Cu(In, Ga)Se2-based polycrystalline materials

(2013) Shota Minoura et al.   JOURNAL OF APPLIED PHYSICS

Long-Range Balanced Electron- and Hole-Transport Lengths in Organic-Inorganic CH3NH3PbI3

(2013) G. Xing et al.   SCIENCE

Characterization of textured SnO2:F layers by ellipsometry using glass-side illumination

(2013) Shinji Yamaguchi et al.   THIN SOLID FILMS

Characterization of μc-Si:H/a-Si:H tandem solar cell structures by spectroscopic ellipsometry

(2013) Daisuke Murata et al.   THIN SOLID FILMS

Enhanced power-conversion efficiency in polymer solar cells using an inverted device structure

(2012) Zhicai He et al.   Nature Photonics

High-precision characterization of textured a-Si:H/SnO2:F structures by spectroscopic ellipsometry

(2011) Masataka Akagawa et al.   JOURNAL OF APPLIED PHYSICS

Universal energy-level alignment of molecules on metal oxides

(2011) Mark T. Greiner et al.   NATURE MATERIALS

Role of the deep-lying electronic states of MoO3 in the enhancement of hole-injection in organic thin films

(2009) M. Kröger et al.   APPLIED PHYSICS LETTERS

Survey of methods to characterize thin absorbing films with Spectroscopic Ellipsometry

(2008) James N. Hilfiker et al.   THIN SOLID FILMS