Influences of different sputtering current on the microstructure and electrical properties of silicon nitride thin films deposited on cemented carbide tools

Title
Influences of different sputtering current on the microstructure and electrical properties of silicon nitride thin films deposited on cemented carbide tools
Authors
Keywords
Silicon nitride thin films, Sputtering current, Microstructure, Insulation performance
Journal
CERAMICS INTERNATIONAL
Volume -, Issue -, Pages -
Publisher
Elsevier BV
Online
2021-08-11
DOI
10.1016/j.ceramint.2021.08.108

Ask authors/readers for more resources

Reprint

Contact the author

Find Funding. Review Successful Grants.

Explore over 25,000 new funding opportunities and over 6,000,000 successful grants.

Explore

Become a Peeref-certified reviewer

The Peeref Institute provides free reviewer training that teaches the core competencies of the academic peer review process.

Get Started