Electronic Modulation Caused by Interfacial Ni‐O‐M (M=Ru, Ir, Pd) Bonding for Accelerating Hydrogen Evolution Kinetics

Title
Electronic Modulation Caused by Interfacial Ni‐O‐M (M=Ru, Ir, Pd) Bonding for Accelerating Hydrogen Evolution Kinetics
Authors
Keywords
-
Journal
Publisher
Wiley
Online
2021-08-24
DOI
10.1002/anie.202110374

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