Direct method for the quantitative analysis of surface contamination on ultra-low background materials from exposure to dust

Title
Direct method for the quantitative analysis of surface contamination on ultra-low background materials from exposure to dust
Authors
Keywords
Surface contamination, Ultralow background materials, Dust radioactivity, Rare event physics, ICP-MS
Publisher
Elsevier BV
Online
2021-01-27
DOI
10.1016/j.nima.2021.165051

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