A Deep Swarm-Optimized Model for Leveraging Industrial Data Analytics in Cognitive Manufacturing

Authors

Keywords

Journal

Volume 17, Issue 4, Pages 2938-2946

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Online

2020-06-30

DOI

10.1109/tii.2020.3005532

Explore over 38,000 international journals covering a vast array of academic fields.

The Peeref Institute provides free reviewer training that teaches the core competencies of the academic peer review process.

Get Started