Development of a cryogenic indentation tool with in situ optical observation, application to the mechanical characterization of II–VI semiconductors

Published 2021 View Full Article

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Title
Development of a cryogenic indentation tool with in situ optical observation, application to the mechanical characterization of II–VI semiconductors
Authors
Keywords
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Journal
SEMICONDUCTOR SCIENCE AND TECHNOLOGY
Volume 36, Issue 3, Pages 035015
Publisher
IOP Publishing
Online
2021-02-04
DOI
10.1088/1361-6641/abe2de
References
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