Determination of wheat spike and spikelet architecture and grain traits using X-ray Computed Tomography imaging
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Title
Determination of wheat spike and spikelet architecture and grain traits using X-ray Computed Tomography imaging
Authors
Keywords
-
Journal
Plant Methods
Volume 17, Issue 1, Pages -
Publisher
Springer Science and Business Media LLC
Online
2021-03-09
DOI
10.1186/s13007-021-00726-5
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