Journal
OPTICS EXPRESS
Volume 29, Issue 8, Pages 12278-12291Publisher
Optica Publishing Group
DOI: 10.1364/OE.418120
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Funding
- European Research Council [GA 713780]
- Deutsche Forschungsgemeinschaft [PR1413/3-2]
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The free space two-port photonic vector network analyzer can perform scattering parameter measurements in the terahertz range and has demonstrated high performance in various applications.
We demonstrate a free space two-port photonic vector network analyzer capable of measuring the scattering parameters of devices and materials in the terahertz range with a frequency coverage of 0.2 - 2 THz in a single system. It is based on photoconductive terahertz sources and detectors driven by a telecom-wavelength femtosecond laser. Being able to cover a bandwidth of one order of magnitude, the system is capable of performing S-parameter measurements deep into the terahertz range, beyond frequencies reachable by their electronic counterparts. We demonstrate high performance at three application examples, namely S-parameter measurements of a split ring resonator array and a distributed Bragg reflector, as well as material parameter extraction of several materials. (C) 2021 Optical Society of America under the terms of the OSA Open Access Publishing Agreement
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