Size dependent fracture strength and cracking mechanisms in freestanding polycrystalline silicon films with nanoscale thickness

Published 2016 View Full Article

  1. Home
  2. Publications
  3. Publication Search
  4. Publication Details
Title
Size dependent fracture strength and cracking mechanisms in freestanding polycrystalline silicon films with nanoscale thickness
Authors
Keywords
Polycrystalline silicon, Thin film, Tensile test, Fracture mechanisms, Size effect
Journal
ENGINEERING FRACTURE MECHANICS
Volume 168, Issue -, Pages 190-203
Publisher
Elsevier BV
Online
2016-11-01
DOI
10.1016/j.engfracmech.2016.10.003

Ask authors/readers for more resources

Protocol

Community support

Reagent

Community support

Reprint

Contact the author

Find the ideal target journal for your manuscript

Explore over 38,000 international journals covering a vast array of academic fields.

Search

Become a Peeref-certified reviewer

The Peeref Institute provides free reviewer training that teaches the core competencies of the academic peer review process.

Get Started
Webinars Posters Questions Hubs Funding Journals Articles Connect Collections Reviewers About Us FAQs Mobile App Privacy Policy Terms of Use
© Peeref 2019-2024. All rights reserved.